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B01=Muthukumaran Malarvel
B01=Prasant Kumar Pattnaik
B01=Soumya Ranjan Nayak
B01=Surya Narayan Panda
Category1=Non-Fiction
Category=TJ
Category=UYQ
COP=United States
Delivery_Delivery within 10-20 working days
Language_English
PA=Available
Price_€100 and above
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Machine Vision Inspection Systems, Machine Learning-Based Approaches

English

Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes image processing, machine vision and, pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry. Now a day's the current research on machine inspection gained more popularity among various researchers, because the manual assessment of the inspection may fail and turn into false assessment due to a large number of examining while inspection process.

This volume 2 covers machine learning-based approaches in MVIS applications and it can be employed to a wide diversity of problems particularly in Non-Destructive testing (NDT), presence/absence detection, defect/fault detection (weld, textile, tiles, wood, etc.), automated vision test & measurement, pattern matching, optical character recognition & verification (OCR/OCV), natural language processing, medical diagnosis, etc. This edited book is designed to address various aspects of recent methodologies, concepts, and research plan out to the readers for giving more depth insights for perusing research on machine vision using machine learning-based approaches.

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Age Group_Uncategorizedautomatic-updateB01=Muthukumaran MalarvelB01=Prasant Kumar PattnaikB01=Soumya Ranjan NayakB01=Surya Narayan PandaCategory1=Non-FictionCategory=TJCategory=UYQCOP=United StatesDelivery_Delivery within 10-20 working daysLanguage_EnglishPA=AvailablePrice_€100 and abovePS=Activesoftlaunch
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Product Details
  • Weight: 454g
  • Dimensions: 10 x 10mm
  • Publication Date: 05 Mar 2021
  • Publisher: John Wiley & Sons Inc
  • Publication City/Country: United States
  • Language: English
  • ISBN13: 9781119786092

About

Muthukumaran Malarvel obtained his PhD in digital image processing and he is currently working as an associate professor in the Department of Computer Science and Engineering at Chitkara University Punjab India. His research interests include digital image processing machine vision systems image statistical analysis & feature extraction and machine learning algorithms. Soumya Ranjan Nayak obtained his PhD in computer science and engineering from the Biju Patnaik University of Technology India. He has more than a decade of teaching and research experience and currently is working as an assistant professor Amity University Noida India. His research interests include image analysis on fractal geometry color and texture analysis jointly and separately. Prasant Kumar Pattnaik PhD (Computer Science) Fellow IETE Senior Member IEEE is a Professor at the School of Computer Engineering KIIT Deemed to be University Bhubaneswar India. He has more than a decade of teaching and research experience. His areas of interest include mobile computing cloud computing cyber security intelligent systems and brain computer interface. Surya Narayan Panda is a Professor and Director Research at Chitkara University Punjab India. His areas of interest include cybersecurity networking advanced computer networks machine learning and artificial intelligence. He has developed the prototype of Smart Portable Intensive Care Unit through which the doctor can provide immediate virtual medical assistance to emergency cases in the ambulance. He is currently involved in designing different healthcare devices for real-time issues using AI and ML.

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