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Theory of CMOS Digital Circuits and Circuit Failures
Theory of CMOS Digital Circuits and Circuit Failures
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A01=Masakazu Shoji
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Analogue electronics
Author_Masakazu Shoji
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Biasing
Bipolar junction transistor
Capacitance
Capacitor
Category1=Non-Fiction
Category=PBKD
Category=TJFC
Characteristic impedance
Circuit design
Circuit switching
CMOS
Common-mode rejection ratio
Computer performance
Contact resistance
COP=United States
DC bias
Delivery_Delivery within 10-20 working days
Depletion and enhancement modes
Differential amplifier
Digital electronics
Digital signal
Distortion
Doping (semiconductor)
Dynamic logic (digital electronics)
Electrical breakdown
Electrical resistivity and conductivity
Electronic circuit
Emitter-coupled logic
eq_isMigrated=2
eq_nobargain
Equivalent circuit
Extrinsic semiconductor
Field-effect transistor
Frequency mixer
Gain (electronics)
Gate oxide
Impedance matching
Inductance
Input impedance
Integrated circuit
Integrated circuit design
Ionized impurity scattering
Language_English
Latch (hardware)
Logic gate
Logic level
Logic optimization
Material failure theory
Memory effect
Negative feedback amplifier
Network analysis (electrical circuits)
Noise (electronics)
Output impedance
PA=Available
Parasitic capacitance
Passivity (engineering)
Power factor
Power inverter
Price_€100 and above
Process variation (semiconductor)
PS=Active
Resistor
Ring oscillator
Semiconductor
Series and parallel circuits
Signal (electrical engineering)
Silicon on insulator
Slew rate
softlaunch
Three-dimensional integrated circuit
Threshold voltage
Transformer
Transistor
Transmission gate
Transmission line
Voltage divider
Voltage drop
Voltage regulation
Voltage source
Voltage spike
Waveform
Product details
- ISBN 9780691632452
- Weight: 1389g
- Dimensions: 203 x 254mm
- Publication Date: 19 Apr 2016
- Publisher: Princeton University Press
- Publication City/Country: US
- Product Form: Hardback
- Language: English
CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates.
Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes. Originally published in 1992. The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These editions preserve the original texts of these important books while presenting them in durable paperback and hardcover editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905.
Theory of CMOS Digital Circuits and Circuit Failures
€357.12
