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Advanced Methods in Automatic Item Generation

Mark J. Gierl | Hollis Lai | Vasily Tanygin
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A01=Hollis Lai
A01=Mark J. Gierl
A01=Vasily Tanygin
Acute Sinusitis
AIG
Author_Hollis Lai
Author_Mark J. Gierl
Author_Vasily Tanygin
automated test item creation process
automatic item generation
Auxiliary Information
banking system
Category=JMBT
Category=JNC
Category=JNDH
Cognitive diagnostic assessment
Cognitive Model Development
cognitive modeling techniques
Computer-based testing
Constraint Coding
Constructed Response Item
Content Codes
content coding
Correct Option
digital assessment tools
Distractor Generation
educational measurement research
educational testing
eq_bestseller
eq_isMigrated=1
eq_isMigrated=2
eq_nobargain
eq_non-fiction
eq_society-politics
formative feedback systems
Generate Test Items
High Quality Test Items
Incorrect Options
Independent Group
International Test Commission Guidelines
Item Development
Item Development Process
Item Generation
Item Model
item model development
monolingual item development
multilingual assessment design
multilingual item generation
Multiple Group Confirmatory Factor Analysis
NLP Technique
Oral Temperature
Panoramic Radiograph
psychometrics
rationale generation
Selected Response Format
Selected Response Item
Selected Response Item Format
selected-response item formats
technology-enhanced educational measurement sector
test item validation

Product details

  • ISBN 9780367458324
  • Weight: 453g
  • Dimensions: 152 x 229mm
  • Publication Date: 19 May 2021
  • Publisher: Taylor & Francis Ltd
  • Publication City/Country: GB
  • Product Form: Paperback
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Description

Advanced Methods in Automatic Item Generation is an up-to-date survey of the growing research on automatic item generation (AIG) in today’s technology-enhanced educational measurement sector. As test administration procedures increasingly integrate digital media and Internet use, assessment stakeholders—from graduate students to scholars to industry professionals—have numerous opportunities to study and create different types of tests and test items. This comprehensive analysis offers thorough coverage of the theoretical foundations and concepts that define AIG, as well as the practical considerations required to produce and apply large numbers of useful test items.
About Hollis Lai | Mark J. Gierl | Vasily Tanygin

Mark J. Gierl is Professor of Educational Psychology at the University of Alberta, Canada. He holds the Tier 1 Canada Research Chair in Educational Measurement.

Hollis Lai is Associate Professor of Dentistry in the Faculty of Medicine and Dentistry at the University of Alberta, Canada.

Vasily Tanygin is a full-stack software developer who has over a decade of experience creating automatic item generation and educational assessment technologies. He graduated with a specialist degree in software systems development from Mari State Technical University, Russia.

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