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J. Patrick Meyer

Applied Measurement with jMetrik

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€62.99
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advanced psychometric analysis guide
Alternate Forms Reliability Estimate
Analysis
Applied
Author_J. Patrick Meyer
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Common Odds Ratio
Cut Scores
Data Management
differential item functioning
educational assessment methods
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Import File Selector
IRT
Item Characteristic Curve
Item Difficulty
Item Parameter
Item Response Models
Item Scoring
jMetrik
Measurement
Meyer
Missing Data
Mixed Format Test
Observed Score
Outfit Statistics
Outfit Values
Partial Credit Model
Percentile Ranks
Polytomous Items
psychometric evaluation
quantitative measurement techniques
Rasch
Rasch Model
Rating Scale Model
Reliability
score equating procedures
Score String
Standard Deviation Ratio
Sum Score
TCC
test fairness analysis
Test Scaling
True Score
Variables Tab

Product details

  • ISBN 9780415531979
  • Weight: 294g
  • Dimensions: 152 x 229mm
  • Publication Date: 25 Jun 2014
  • Publisher: Taylor & Francis Ltd
  • Publication City/Country: GB
  • Product Form: Paperback
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Description

jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.
About J. Patrick Meyer

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia