Atomic Force Microscopy in Adhesion Studies
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Adhesion Force
Adhesion Force Distributions
Adhesion Force Measurements
Adhesion Force Values
AFM
AFM Cantilever
AFM Measurement
Aluminum Epoxy Resin Joints
American Chemical Society
capillary wetting phenomena
Category=PDND
Cfs
colloidal probe microscopy
Contact Angle
contact mechanics models
Data Set
Derjaguin Approximation
Epoxy Side
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Gelatin Capsules
Hamaker Constant
High Indentation Depth
Indentation Depth
JKR Model
Lactose Particle
Larger Indentation Depths
Lifshitz Van Der Waals
nanoindentation techniques
particle adhesion force analysis
polymer composite interfaces
Self-assembled Monolayers
Separation Rate
surface force measurement
Van Der Waals
Product details
- ISBN 9789067644341
- Weight: 1680g
- Dimensions: 156 x 234mm
- Publication Date: 01 Oct 2005
- Publisher: Brill
- Publication City/Country: NL
- Product Form: Hardback
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Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, and development of new technologies for processing and modification of materials. This volume is a comprehensive review of AFM techniques and their application in adhesion studies. It is intended for both researchers and students in engineering disciplines, physics and biology. Over 100 authors contributed to this book, summarizing current status of research on measurements of colloidal particle-solid adhesion and molecular forces, solid surface imaging and mapping, and discussing the contact mechanics models applicable to particle-substrate and particle-particle systems.
