Design and Analysis of Accelerated Tests for Mission Critical Reliability
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A01=Bruce G. LeFevre
A01=Michael J. LuValle
A01=SirRaman Kannan
Accelerated Failure Time Model
accelerated life testing
Accelerated Testing
Acceleration Transform
activation
Activation Energy
advanced reliability test design
arrow
Arrow Diagram
Asymptotic Relative Efficiency
Author_Bruce G. LeFevre
Author_Michael J. LuValle
Author_SirRaman Kannan
beta
Category=PB
Data Set
Degradation Data
degradation modeling
demarcation
Demarcation Mapping
diagram
distribution
energy
Environmental Stress Screening
eq_isMigrated=1
eq_isMigrated=2
eq_nobargain
Evanescent Process
Exponential Model
Failure Time
failure time analysis
Failure Time Data
Failure Time Distribution
Hourly Cycles
kinetic
Kinetic Model
kinetic modeling methods
Kinetic Models Analysis
Log Likelihood
mapping
model
Plastic Strain
Pseudo Likelihood
Pseudo-maximum Likelihood
Pseudo-maximum Likelihood Estimation
reliability engineering
S-PLUS statistical computing
Vapor Pressure Model
Weibull Plot
Product details
- ISBN 9781584884712
- Weight: 476g
- Dimensions: 156 x 234mm
- Publication Date: 27 Apr 2004
- Publisher: Taylor & Francis Inc
- Publication City/Country: US
- Product Form: Hardback
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Early approaches to accelerated testing were based on the assumption that there was a simple acceleration factor that would correspond to a linear scaling of time from the operating stress to the accelerating stress. This corresponds to the simplest physical model of the kinetics governing the underlying degradation, but this simple model does not always hold. We need to understand what more complex physical models may look like.
Design & Analysis of Accelerated Tests for Mission Critical Reliability presents innovative theory and methods for recognizing and handling the more complicated, cases often encountered in practice. The theory integrates a physical understanding of underlying phenomena and the statistical modeling of observation "noise" to provide a single theoretical framework for accelerated testing. The treatment includes general approaches that can be used with various computational software packages and an explicit computing environment in S-PLUS. Source code written by the authors is included and available for download from http://www.crcpress.com/e_products/downloads.
For practitioners, this book provides immediately useable tools. For researchers, it presents intriguing open questions. And for the academic community, numerous worked examples, end-of-chapter exercises, and a format that relegates technical and theoretical details to chapter appendices make this an outstanding supplementary textbook for senior and graduate-level students.
Michael J. LuValle, Bruce G. LeFevre, SirRaman Kannan
