Electron and Ion Microscopy and Microanalysis
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advanced imaging technology
atomic structure analysis
Backscattered Electrons
Category=PDND
CBED Pattern
crystallography methods
Dark Field Images
Electron Diffraction Patterns
electron microscopy principles and applications
Electron Optical System
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Ewald Sphere
Field Emission
Field Ion Microscope
GRAIN BOUNDARY
High Voltage Electron
HVEM
Ion Optics
Kikuchi Diffraction Pattern
Kikuchi Lines
materials characterization
microscopy instrumentation
Partial Disloca Tions
Reciprocal Lattice Points
SAED
Selected Area Electron Diffraction Pattern
Stacking Fault
surface analysis techniques
TEM
Thin Film
Thin Section
Thin Stainless Steel Foils
Unit Cell
Wave Function
Product details
- ISBN 9780824785567
- Weight: 1598g
- Dimensions: 178 x 254mm
- Publication Date: 25 Jul 1991
- Publisher: Taylor & Francis Inc
- Publication City/Country: US
- Product Form: Hardback
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The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
Lawrence E. Murr
