A01=R. Brydson
advanced transmission microscopy techniques
analytical electron microscopy
Author_R. Brydson
Category=PDND
Category=PHM
Compton Profile
core loss spectroscopy
Double Differential Cross-section
Drift Tube
Eel
Eel Spectrum
electron energy loss spectroscopy
elemental mapping techniques
Energy Loss Function
Energy Window
energy-filtered imaging
energy-filtered transmission electron microscopic
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FLAPW
Image SNR
Incident Beam Energy
Incident Electron
Inelastic Scattering
Interband Transitions
Ionization Edge
IOP Publishing
Low Loss Region
Low Loss Spectrum
material thin samples analysis
materials characterisation
NEXAFS Spectroscopy
Partial Ionization Cross-section
quantitative microanalysis
spectroscopic imaging methods
Spectrum Imaging
Stem Mode
TEM Bright Field Image
Transition Metal
transmission electron microscope
Valence Electron Density
XANES
Product details
- ISBN 9781859961346
- Weight: 250g
- Dimensions: 156 x 234mm
- Publication Date: 15 Jun 2001
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Paperback
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Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.
Rik Brydson is a reader in Materials Characterization in the Materials Department at the University of Leeds in the UK. He has extensive experience of the application of microanalysis, particularly EELS, to a large range of chemical, physical, geological and materials problems.
