Electron Microscopy and Analysis

Regular price €92.99
A01=John Humphreys
A01=Peter J. Goodhew
A01=Richard Beanland
aberration
advanced electron microscopy textbook
analytical electron methods
Author_John Humphreys
Author_Peter J. Goodhew
Author_Richard Beanland
Backscattered Electrons
beam
Beam Current
bioscience imaging applications
Category=PDND
CBED Pattern
Condenser Lens
Crystal Spectrometer
Dark Field Image
Diffracted Beam
diffraction
Diffraction Pattern
EDS System
Eel Spectrum
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Everhart Thornley Detector
Ewald Sphere
Ewald Sphere Construction
Extinction Contours
field
Higher Order Laue Zones
inelastic
Kikuchi Lines
materials characterisation
microscopy instrumentation
Objective Aperture
pattern
Reciprocal Lattice
Reciprocal Lattice Point
scanning electron techniques
scattering
Secondary Electrons
specimen
spherical
Spherical Aberration
Stacking Fault
Superconductor Barium Yttrium Copper Oxide
TEM Specimen
thin
transmission electron imaging
Undeflected Beam

Product details

  • ISBN 9780748409686
  • Weight: 380g
  • Dimensions: 156 x 234mm
  • Publication Date: 30 Nov 2000
  • Publisher: Taylor & Francis Ltd
  • Publication City/Country: GB
  • Product Form: Paperback
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Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.
Peter J. Goodhew, John Humphreys The University of Manchester, Richard Beanland GEC Marconi Materials Technology, England.