Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997
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A01=John M. Rodenburg
A01=Rodenburg
ADF
ADF Image
advanced electron optics
Author_John M. Rodenburg
Author_Rodenburg
Category=PDND
CBED
CBED Pattern
Dark Field Image
Dense
EDX Analysis
Eel Study
Electron Diffraction Pattern
Electron Energy - Loss Spectrum
Electron Energy Loss Spectroscopy
electron microscopy conference proceedings
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Gatan Imaging Filter
HAADF
HREM
Low Loss Spectra
materials microstructure analysis
MgO Substrate
scanning probe techniques
Selected Area Diffraction
Selected Area Diffraction Patterns
semiconductor characterization
Spherical Aberration
Stacking Fault
Superimposed
surface science applications
TEM Sample
x-ray microanalysis
YBCO
YBCO Film
Zone Axis
Product details
- ISBN 9780750304412
- Weight: 1338g
- Dimensions: 156 x 234mm
- Publication Date: 01 Jan 1997
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Hardback
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Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.
