Electron Microscopy and Analysis 2001
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advanced electron microscopy techniques
AFM Image
Bright Field TEM
Bright Field TEM Image
Category=PDND
CBED Pattern
Collection Semi-angles
Convergence Semi-angle
Core Loss Spectra
Domain Wall
EFTEM Tomography
Electron Energy Loss Spectroscopy
Electron Holography
Electron Tomography
elemental mapping methods
Energy Filtering Transmission Electron Microscope
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Field Emission Gun Transmission Electron
GB
HAADF Image
HAADF Stem Image
High Resolution Electron Microscopy
HREM Image
Lorentz Transmission Electron Microscopy
materials characterization
microstructure imaging
Parallel Electron Energy Loss Spectroscopy
scanning probe techniques
solid state analysis
Stacking Faults
surface science applications
TEM Specimen
Tilt Series
Transition Metal
Product details
- ISBN 9780750308120
- Weight: 929g
- Dimensions: 156 x 234mm
- Publication Date: 01 Dec 2001
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Hardback
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Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.
M. Aindow. C.J. Kiely, Dept of Engineering, University of Liverpool, UK.
