Electron Microscopy and Analysis 2003
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advanced electron microscopy techniques
AEA Technology
AFM
Angle Annular Dark Field Image
annular
Beam Tilt
biomaterials imaging
boundaries
Category=PDN
Category=PHJ
Category=PNFC
Category=PSA
Data Sets
Dislocation Loops
Eel
Eel Spectrum
EFTEM
Electron Holography
Electron Tomography
emission
energy
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Fib Milling
field
Field Emission Gun Transmission Electron
grain
gun
HAADF
HAADF Imaging
high-angle
InGaN Quantum Wells
loss
materials characterization
microscopy instrumentation
nanostructure analysis
QD
QW
Sample Preparation
scanning probe microscopy
SEM
spectroscopy
Stacking Faults
surface interface studies
TEM Analysis
TEM Imaging
UHR
Zone Axis
Product details
- ISBN 9780367394530
- Weight: 453g
- Dimensions: 156 x 234mm
- Publication Date: 17 Oct 2019
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Paperback
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Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.
Stephen McVitie, David McComb
