Energy Dispersive X-ray Analysis in the Electron Microscope
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A01=AJ Garratt-Reed
A01=DC Bell
atomic
Author_AJ Garratt-Reed
Author_DC Bell
Beam Voltage
Category=PS
characteristic
Characteristic X-rays
count
crystal
Crystal Spectrometers
detectors
EDX Detector
EDX Spectrum
EDX System
Eel Spectrum
Electron Energy Loss Spectroscopy
Electron Hole Pair
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Fluorescence Yield
HPGe Detector
Incident Electron
Incomplete Charge Collection
Ionization Cross-section
Mass Absorption Coefficients
microprobe
NiO Thin Film
number
Pulse Processor
rate
SDD
SEM
spectrometer
spectrum
Successful Stem
Top Hat Filtering
X-ray Detector
X-ray Mapping
X-ray Microanalysis
ZAF Correction
Product details
- ISBN 9781859961094
- Weight: 430g
- Dimensions: 152 x 229mm
- Publication Date: 10 Jul 2003
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Paperback
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This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical method is more suitable for their planned application.
