absorption
advanced laboratory instrumentation
analysis
analytical chemistry
Category=PNFS
characteristic
Characteristic X-rays
count
Count Rate
detection
edge
EDXRF Spectrum
Energy Resolution
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Escape Peaks
fluorescence spectroscopy methods
Focal Spot
Fundamental Parameter Method
IBA Technique
Incomplete Charge Collection
Input Count Rate
Ionization Cross Section
Limiting Count Rate
limits
Net Peak Area
NIST SRM
Nuclear Microprobe
polarized beam x-ray fluorescence applications
Portable XRF Analyzer
Proportional Detectors
quantitative elemental analysis
rate
Rh Tube
sample matrix effects
Sample Preparation
Secondary Target
synchrotron radiation techniques
tube
TXRF Spectrometer
Van Grieken
WD Spectrometer
X-ray Tube
xrf
XRF Analysis
Product details
- ISBN 9780824706005
- Weight: 1814g
- Dimensions: 210 x 280mm
- Publication Date: 27 Nov 2001
- Publisher: Taylor & Francis Inc
- Publication City/Country: US
- Product Form: Hardback
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"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
Rene van GriekenAndrzej Markowicz
