In-Situ Transmission Electron Microscopy Experiments
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- ISBN 9783527347988
- Weight: 907g
- Dimensions: 170 x 244mm
- Publication Date: 21 Jun 2023
- Publisher: Wiley-VCH Verlag GmbH
- Publication City/Country: DE
- Product Form: Hardback
- Language: English
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Design and execute cutting-edge experiments with transmission electron microscopy using this essential guide
In-situ microscopy is a recently-discovered and rapidly-developing approach to transmission electron microscopy (TEM) that allows for the study of atomic and/or molecular changes and processes while they are in progress. Experimental specimens are subjected to stimuli that replicate near real-world conditions and
their effects are observed at a previously unprecedented scale. Though in-situ microscopy is becoming an increasingly important approach to TEM, there are no current texts combining an up-to-date overview of this cutting-edge set of techniques with the experience of in-situ TEM professionals.
In-Situ Transmission Electron Microscopy Experiments meets this need with a work that synthesizes the collective experience of myriad collaborators. It constitutes a comprehensive guide for planning and performing in-situ TEM measurements,
incorporating both fundamental principles and novel techniques. Its combination of technical detail and practical how-to advice makes it an indispensable introduction to this area of research.
In-Situ Transmission Electron Microscopy Experiments readers will also find:
- Coverage of the entire experimental process, from method selection to experiment design to measurement and data analysis
- Detailed treatment of multimodal and correlative microscopy, data processing and machine learning, and more
- Discussion of future challenges and opportunities facing this field of research
In-Situ Transmission Electron Microscopy Experiments is essential for graduate students, post-doctoral fellows, and early career researchers entering the field of in-situ TEM.
Renu Sharma, PhD, is an NIST Emeritus Fellow and worked as project leader there from 2009 to 2019. Before working at NIST, she was Senior Research Scientist in the LeRoy Eyring Center for Solid State Science at Arizona State University, as well as an affiliated faculty member in multiple departments. She is a pioneer in the field of transmission electron microscopy who has published extensively on the subject.
