Information and Measurement

Regular price €198.40
Quantity:
In stock with our UK publisher. 14-28 days
Delivery/Collection within 10-20 working days
14 days return policy Shipping & Delivery
A01=J.C.G Lesurf
advanced noise reduction methods
Amplifier's Input Resistance
Analog Integrator
Author_J.C.G Lesurf
Bandpass Filter
Category=PH
Cd Player
Clip
Data Thinning
digital signal analysis
eq_bestseller
eq_isMigrated=1
eq_isMigrated=2
eq_nobargain
eq_non-fiction
eq_science
error correction codes
Input Resistance
Input Signal
Low Pass Filter
measurement uncertainty
Noise Power
Noise Power Spectral Density
Noise Ratio
Noise Voltage
Output Voltage
Parity Bits
pF
phase sensitive detection
Random Noise
Run Length Encoded
Sampling Theorem
sensor instrumentation
Shannon's Equation
signal processing techniques
Superimposed
Thermal Noise
Total Measurement Time
Vice Versa
Voltage Gain

Product details

  • ISBN 9781138429949
  • Weight: 453g
  • Dimensions: 156 x 234mm
  • Publication Date: 13 Sep 2023
  • Publisher: Taylor & Francis Ltd
  • Publication City/Country: GB
  • Product Form: Hardback
Secure checkout Fast Shipping Easy returns
Information technology is arguably the most important scientific topic needed for understanding and participating in our increasingly complex technological world. Using simple physical arguments and extensive examples, Information and Measurement, Second Edition shows how this theory can be put into practice. Twice awarded the UK National Metrology Prize by the National Physical Laboratory for his outstanding contributions to measurement science and technology, the author includes the basic mathematical, physical, and engineering concepts required, illustrating their interrelationship in a clear, concise manner. The broad coverage includes topics taught in a variety of courses. This book will be an invaluable study aid for senior undergraduate and graduate students in physics, electrical engineering, and computer science, specifically studying instrumentation, measurement science, and information science. It will also be a useful reference for practicing scientists and engineers.

More from this author