A01=Francis M. Mirabella
advanced IRS applications in materials science
ATR Accessory
ATR Cell
ATR Crystal
ATR Spectroscopy
ATR Spectrum
attenuated total reflection
Attenuation Index
Author_Francis M. Mirabella
Category=PNFS
Critical Angle
Dichroic Ratios
Effective Thicknesses
electrochemical surface studies
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Evanescent Field
Evanescent Wave
Fresnel's Equations
Fresnel’s Equations
Herman's Orientation Function
Herman’s Orientation Function
Internal Reflection
Internal Reflection Spectroscopy
IR ATR
Ire
membrane infrared techniques
MIR
molecular orientation analysis
Optical Constants
optical constants determination
Perpendicular Polarization
polymer analysis
Rarer Medium
Refractive Index
semiconductor characterization
sophisticated fundamental theory
TM Wave
Total Reflection
vibrational spectroscopy
Zinc Selenide
Product details
- ISBN 9780824787301
- Weight: 725g
- Dimensions: 156 x 234mm
- Publication Date: 30 Oct 1992
- Publisher: Taylor & Francis Inc
- Publication City/Country: US
- Product Form: Hardback
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Presents coverage of internal reflection spectroscopy (IRS) and its applications to polymer, semiconductor, biological, electrochemical and membrane research. It describes the theory and procedures and identifies the spectral regions, from materials characterization to process monitoring.
Francis M. Mirabella, Jr. is Associate Scientist of Polymer Physics at Quantum Chemical Corporation, Morris, Illinois. The author or coauthor of over 55 journal articles and book chapters and author of one book, he is a member of the American Chemical Society, the Society for Applied Spectroscopy, and the Coblentz Society. Dr. Mirabella has been active in the development of internal reflection spectroscopy and has organized a series of symposia through the Federation of Analytical Chemistry and Spectroscopy Societies' national meetings. He received the M.S. degree (1974) in organic chemistry and the Ph.D. degree (1975) in polymer science from the University of Connecticut, Storrs.
