Introduction to Scanning Transmission Electron Microscopy
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A01=Anthony J. Garratt-Reed
A01=P.J. Goodhew
A01=Prof Gordon Lorimer
A01=Robert Keyse
ADF
advanced microscopy education
Annular Dark Field Image
Annular Dark Field Stem Image
Author_Anthony J. Garratt-Reed
Author_P.J. Goodhew
Author_Prof Gordon Lorimer
Author_Robert Keyse
BF Detector
Bright Field Stem Image
Category=PDND
CBED Pattern
Cementite Plate
Collector Aperture
Convergence Angle
Dedicated STEMs
diffraction analysis
Eel Spectrum
Electron Energy Loss Spectrometer
electron microscopy techniques
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eq_isMigrated=1
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eq_science
Field Stem Image
HAADF Image
materials characterisation
microanalysis instrumentation
nanoscale imaging methods
Objective
Objective Aperture
Objective Lens
Parallel Electron Energy Loss Spectrometers
Probe Stem
quantitative electron probe analysis
Sad Pattern
Scanning Transmission Electron Microscopy Instruments
Selected Area Diffraction
Spherical Aberration
Stem Analysis
Stem Image
Product details
- ISBN 9781859960660
- Weight: 220g
- Dimensions: 156 x 234mm
- Publication Date: 15 Jun 1997
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Paperback
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STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.
