Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects
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A01=Jean- Paul Morniroli
advanced microscopy techniques
Author_Jean- Paul Morniroli
back
Category=PNT
crystallographic analysis
defect analysis using LACBED
deficiency
diffraction pattern interpretation
electron-matter interactions
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focal
incident
lens
lines
materials characterization
objective
parallel
patterns
plane
transmission electron microscopy
Product details
- ISBN 9782901483052
- Weight: 612g
- Dimensions: 152 x 229mm
- Publication Date: 01 Nov 2004
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Paperback
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A publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.
The author Jean- Paul Morniroli is a professor in the Ecole Nationale Superieure de Chimie of Lille: his research is performed in the Laboratoire de Metallurgie et Genie des Materiaux CNRS 8517 of the Universite des Sciences at Technologies de Lille. He is a specialist in electron diffraction. The translator Etienne Bres is a Professor in the Universite des Sciences at Technologies de Lille, He is a specialist in the nanoscale characterization of biological and synthetic nanomaterials.
