Linear and Chiral Dichroism in the Electron Microscope

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advanced magnetic microscopy techniques
angular
atomic spin mapping
Category=PDN
Category=PDND
Category=PHVD
Category=PSA
ch12
Chiral Dichroism
Chirality in EELS and the Role of the Angular Momentum
Data Cube
december
December Rps
density functional theory
dichroic
Dichroic Signal
diffraction
Diffraction Plane
Eel
electron energy loss
Electron Energy Loss Spectrometry
EMCD Techniques and Geometries
energy loss spectroscopy
eq_bestseller
eq_isMigrated=1
eq_isMigrated=2
eq_nobargain
eq_non-fiction
eq_science
Fast Electron
HAADF Image
Incident Wave Vector
L2 Edge
L3 Edge
magnetic materials analysis
Magnetic Quantum Number
momentum
Momentum Resolved ELNES
Ms Ratio
Multiple-Scattering Theory of Circular Dichroism
multiplet calculation methods
Orbital Angular Momentum
Orbital Moments
pan
Pan Stanford Ch12
Prospects for Spin Mapping with Atomic Resolution
rps
signal
Spin Orbit Coupling
stanford
Stem Mode
Sum Rules
Transition Metals
Wave Function
XMCD
XMCD Signal
XMCD Spectrum

Product details

  • ISBN 9789814267489
  • Weight: 566g
  • Dimensions: 152 x 229mm
  • Publication Date: 01 Mar 2012
  • Publisher: Pan Stanford Publishing Pte Ltd
  • Publication City/Country: SG
  • Product Form: Hardback
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This book describes energy loss magnetic chiral dichroism (EMCD), a phenomenon in energy loss spectroscopy discovered in 2006. EMCD is the equivalent of XMCD but is based on fast probe electrons in the electron microscope. A spatial resolution of 2 nm has been demonstrated, and the lattice-resolved mapping of atomic spins appears feasible. EMCD is, thus, a promising technique for magnetic studies on the nanometer and sub-nanometer scale, providing the technical and logistic advantages of electron microscopy, such as in situ chemical and structural information, easy access, and low cost.

Peter Schattschneider studied physics at the Vienna University of Technology, Austria, and finished in 1973 with a diploma thesis on diffusion profiles in thin films. In 1974, he enrolled in the study of college teacher for physics and mathematics at the University of Vienna and obtained a mag. rer. nat. degree in 1977. After his PhD thesis on X-ray diffraction of binary alloys, he left Vienna University of Technology in 1976 and came back in 1980 as assistant at the Institute for Applied and Technical Physics. In the meantime, he worked in an engineering enterprise, dealing with remote sensing (air- and spaceborne sensors). In 1981, he obtained the Theodor-Körner award for work on the EEL spectrometer installed at the old ELMISKOP IA. In 1988, he became assistant professor at the Institute for Applied and Technical Physics of the Vienna University of Technology, where his main research interests were electron microscopy, inelastic electron–matter interactions, and electron energy-loss spectrometry. In 1992 and 1993, he was employed by the CNRS (Centre Nationale de la Recherche Scientifique) in Paris. Since 1995, he has been professeur invité at the École Centrale Paris. From January 2000 to June 2006, he was head of the University Service Center for Transmission Electron Microscopy (USTEM).