Memory Editing Mechanisms

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associative recognition
Category=JM
cognitive distortions
Conceptual Cue
Critical Lures
developmental memory differences
Distinctiveness Heuristic
DRM
DRM Paradigm
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Exclusion List
Eyewitness memory
False Alarm Rate
False Events
False Memories
false memory formation
False Recall
False Recognition
Full Attention Condition
Fuzzy Trace Theory
Item Specific Information
Longe ISI
memory distortion mechanisms in research
Memory research
Non-presented Critical Lure
Phantom ROC
Quality control mechanisms
Recollection Rejection
Recollection-based monitoring
Related Lures
Roc Curve
Short ISI
Signal Detection
source monitoring
Source Monitoring Processes
Studied Items
Unrelated Lures
Verbatim Trace

Product details

  • ISBN 9781841698151
  • Weight: 260g
  • Dimensions: 202 x 272mm
  • Publication Date: 03 Aug 2006
  • Publisher: Taylor & Francis Ltd
  • Publication City/Country: GB
  • Product Form: Paperback
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This special issue of Memory is devoted to an investigation of those mechanisms by which memory is edited for inaccuracies and inconsistencies. In the past 20 years false memories have been investigated from a variety of different angles. Substantial evidence indicates that false memories can be created in a number of different situations including word learning, sentence and story memory, eyewitness memory, memory for faces, and memory for naturalistic scenes. In each of these cases, it has been found that memory is subject to a range of distortions. But there has also been an increasing recognition that this is only half the story. For although memory is subject to distortion, there are also quality control mechanisms that are utilized that allow our memories to be relied on as reasonably accurate under most circumstances. These mechanisms include recollection rejection, distinctiveness, and source memory. The focus of this special issue then, is on the interplay between those mechanisms that distort memory and those mechanisms that protect memory against distortion.

James Michael Lampinen, Timothy N. Odegard