advanced microanalysis methods
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analytical microscopy
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Characteristic X-ray Intensities
Diffusion Couple Experiments
Dove Tails
electron beam techniques
Electron Energy Loss Spectroscopy
Emitted X-ray Intensity
Energy Dispersive X-ray Spectrometry
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Field Emission Scanning Electron Microscope
Gaussian Smearing
In-situ Transmission Electron Microscopy
Interfacial Force Microscope
ion beam analysis
IOP
Lo Phonon
Mem Device
Mesoporous Silica Structures
Microbeam Analysis
photon-matter interaction
quantitative spectroscopy
radiation damage effects
Sample Surface Roughness
STM Experiment
STM Image
UHV Condition
WDS Analysis
Wien Filters
Product details
- ISBN 9780750306850
- Weight: 1020g
- Dimensions: 156 x 234mm
- Publication Date: 01 Jan 2000
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Hardback
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Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.
