Modeling Fluctuations in Scattered Waves
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A01=E. Jakeman
A01=K. D. Ridley
advanced wave fluctuation modeling
Author_E. Jakeman
Author_K. D. Ridley
Category=PHD
Complex Gaussian Process
correlation
Correlation Function
Cumulative Distribution Function
electromagnetic wave propagation
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experimental data simulation
Fraunhofer Region
fresnel
Fresnel Region
function
Gamma Process
gaussian
Gaussian Process
Gaussian Speckle
Gaussian Variable
index
intensity
Intensity Correlation Function
Intensity Fluctuations
Negative Exponential Distribution
non-Gaussian noise models
Outer Scale
phase
Phase Correlation Function
Phase Fluctuations
Phase Screen
Phase Spectrum
polarization effects
process
Propagation Distance
Random Phase Screen
Random Walk Model
remote sensing techniques
Scattered Field
Scattered Wave
scintillation
Scintillation Index
screen
Speckle Size
statistical signal analysis
Wave Front
Product details
- ISBN 9780750310055
- Weight: 589g
- Dimensions: 156 x 234mm
- Publication Date: 19 Jun 2006
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Hardback
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Fluctuations in scattered waves limit the performance of imaging and remote sensing systems that operate on all wavelengths of the electromagnetic spectrum. To better understand these fluctuations, Modeling Fluctuations in Scattered Waves provides a practical guide to the phenomenology, mathematics, and simulation of non-Gaussian noise models and discusses how they can be used to characterize the statistics of scattered waves.
Through their discussion of mathematical models, the authors demonstrate the development of new sensing techniques as well as offer intelligent choices that can be made for system analysis. Using experimental results and numerical simulation, the book illustrates the properties and applications of these models. The first two chapters introduce statistical tools and the properties of Gaussian noise, including results on phase statistics. The following chapters describe Gaussian processes and the random walk model, address multiple scattering effects and propagation through an extended medium, and explore scattering vector waves and polarization fluctuations. Finally, the authors examine the generation of random processes and the simulation of wave propagation.
Although scattered wave fluctuations are sources of information, they can hinder the performance of imaging and remote sensing systems. By providing experimental data and numerical models, this volume aids you in evaluating and improving upon the performance of your own systems.
Jakeman, E.; Ridley, K. D.
