Particle Characterization in Technology
Regular price
€248.00
advanced particle morphology research
Age Group_Uncategorized
Age Group_Uncategorized
Alvin Lieberman
automatic-update
B01=John Keith Beddow
Brian H. Kaye
British Pharmacopoeia
bulk material handling
Bulk Solids
Category1=Non-Fiction
Category=PN
COP=United Kingdom
David L. Davidson
David L. O. Smith
Delivery_Pre-order
Dust Explosion
Dust Fires
Dust Layer
eq_bestseller
eq_isMigrated=2
eq_nobargain
eq_non-fiction
eq_science
explosion risk assessment
Fractal Description
Fractal Dimension
image analysis techniques
John A. Hersey
John Gavrilovic
John Keith Beddow
K. N. Palmer
LAMMA
Language_English
Lateral Stress Ratio
Maximum Explosion Pressure
Maximum Feret's Diameter
Minimum Ignition Energy
Minimum Ignition Temperature
Mohr Circle
Moisture Content
PA=Temporarily unavailable
Particle Size Analysis Result
particle size distribution
Particle Systems
Paul Wieser
pharmaceutical powder analysis
powder technology
Price_€100 and above
Primary Ion Beam
PS=Active
R. F. Karuhn
R. H. Berg
Raimund Kaufmann
Richardson Plot
Robert A. Lohnes
RSFs
Sample Preparation
Shepard Kinsman
Si Yield
Sim
Sim Technique
softlaunch
Stress Path
Product details
- ISBN 9781315896250
- Weight: 650g
- Dimensions: 178 x 254mm
- Publication Date: 29 Nov 2017
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Hardback
- Language: English
Secure
checkout
Fast Shipping
Easy returns
Volume I present an important exposition of some of the most significant areas where particle characterization is applied. The technological fields include pharmaceutical materials, bulk solids, and explosions.
John Keith Beddow Professor of Chemicals and Materials Engineering, Division of Materials Engineering, University of Iowa.
