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Particle Characterization in Technology
Particle Characterization in Technology
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€248.00
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A01=J.K. Beddow
Adipic Acid
advanced particle morphology analysis
Age Group_Uncategorized
Age Group_Uncategorized
Andy Guo
Arthur F Vetter*
Author_J.K. Beddow
automatic-update
C. Seemuth*
Camera
Category1=Non-Fiction
Category=PN
Chi-Ren Chang
Class Intervals
Convex Hull
COP=United Kingdom
Data Set
David L. O. Smith
David W. Luerkens
Delivery_Pre-order
End Members
eq_bestseller
eq_isMigrated=2
eq_nobargain
eq_non-fiction
eq_science
Fourier Descriptors
Gordon Butters
granulometry methods
Gray Level
Gregory R. Carmichael
image analysis techniques
Iron Powder
James C. Bezdek
John Keith Beddow
Keishi Gotoh
Ken-Ichi Kanatani
Kenneth H. Solomon
Language_English
Louise Hua
Maximum Entropy Method
Membership Function
microstructure evaluation
Ming-Jau Yin
Mitsuyoshi Kumamoto
Morphic Characteristics
Morphic Properties
Morphic Terms
Morphological Analysis
Ottawa Sand
P. Ramakrishnan
PA=Temporarily unavailable
Particle Morphology
Particle Profile
Particle Shape Analysis
particle size distribution
Paul Swanson
Poh-Leng Leong
Price_€100 and above
PS=Active
PVC Powder
quantitative morphology
Relative Entropy
Representative Photomicrographs
Robert Ehrlich
Russell V. Lenth
S. Collins
Samir Rajpal
Shape Analysis
shape factor measurement
Shape Terms
softlaunch
Stephen Kennedy
T. P. Meloy
Toshio Inoue
Tv Camera
William E. Full
Product details
- ISBN 9781315896267
- Weight: 690g
- Dimensions: 178 x 254mm
- Publication Date: 29 Nov 2017
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Hardback
- Language: English
The first section of volume II deals with both theory and methods of morphological analysis, it then discusses data analysis, and finally, the applications.
Particle Characterization in Technology
€248.00
