Absorption Correction Factor
accelerated ion beam-surface interactions
advanced microscopy methods
analytical electron microscopy
Auger electron spectroscopy
Auger Electrons
Auger Spectrum
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Category=PHJ
Concentric Hemispherical Analyser
Cylindrical Mirror Analyser
Data Set
Edx Analysis
Eel
Electron Probe X-ray Microanalysis
Electron Spectroscopy
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Incident Electrons
Ionisation Cross-sections
IOP
IOP Publishing
materials composition analysis
NATO Advance Study Institute
Orbital Angular Momentum
Parallel Electron Energy Loss Spectrometer
Primary Ion Beam
Projectile Ions
quantitative microbeam analytical techniques
quantitative surface analysis applications
Sem Images
spectroscopy techniques
Static Sim
Stopping Power
surface analytical imaging
surface characterization
thin film evaluation
Transition Metals
X-ray Absorption Spectroscopy
X-ray Intensity
X-ray photoelectron spectroscopy
Product details
- ISBN 9780750302562
- Weight: 952g
- Dimensions: 156 x 234mm
- Publication Date: 01 Jan 1993
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Hardback
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Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions.
