Radiation Detection Systems

Regular price €62.99
Quantity:
In stock with our UK publisher. 14-28 days
Delivery/Collection within 10-20 working days
14 days return policy Shipping & Delivery
advanced photon counting imaging methods
ASIC
bone dosimetry techniques
Cadmium Zinc Telluride
Category=PHN
Cc
CdTe Crystals
CdTe Detectors
CdZnTe Crystals
Computed Tomography Imaging
Contrast Agents
Count Rates
CT Imaging
CZT
CZT Crystal
Dual Energy CT
Energy Bins
Energy Position
eq_bestseller
eq_isMigrated=1
eq_isMigrated=2
eq_nobargain
eq_non-fiction
eq_science
FEP
FEP Efficiency
Full-Field Digital Mammography
Grating-Based Phase-Contrast X-Ray Imaging Technique
Imaging Technologies
Incomplete Charge Collection
luggage scanning systems
Medical Imaging
Medical X-Ray
Monte Carlo Modeling
Mri System
multimodal medical imaging
Nuclear Medicine
Parallel ASIC Design
PCD
PET
Pet System
Photon Counting
Photon-Counting Detector Applications
Photon-Counting Detectors
Photon-Counting X-Ray Computed Tomography
Photon-Counting X-Ray CT
Pixelated Semiconductor
Positron Emission Tomography
Pulse Pileup
Radiation Detection
scintillator materials research
semiconductor detector technology
silicon photomultiplier applications
Silicon Photomultipliers
Single-Photon Emission Computed Tomography
SiPMs
SPECT
SPECT Imaging
SPECT Imaging System
SPECT System
Spectral Clinical Radiology
SPET
Tube Current
Voxel Imaging PET Project
Voxel Imaging Positron Emission Tomography Project
Witwatersrand Supergroup
X-ray Computed Tomography
X-Ray Detectors

Product details

  • ISBN 9780367707170
  • Weight: 540g
  • Dimensions: 156 x 234mm
  • Publication Date: 27 May 2024
  • Publisher: Taylor & Francis Ltd
  • Publication City/Country: GB
  • Product Form: Paperback
Secure checkout Fast Shipping Easy returns

The advances in semiconductor detectors, scintillators, photodetectors such as silicon photomultipliers (SiPM), and reaodut electronics have experienced tremendous growth in recent years in terms of basic technologies and variety of applications.The second edition of the book Radiation Detection Systems presents variety of radiation detection systems giving readers a broad view of the state-of–the-art in the design of detectors, front-end electronics and systems offering optimized choices of the detection tools for a particular application. The new edition has been divided into two volumes. This first volume, on Sensor Materials, Systems, Technology and Characterization Measurements puts emphasis on sensor materials, detector structures, front electronics technology and their designs as well as system optimization for different applications. Also, the book include characterization measurements of the developed detection systems. Featuring contributions from leading experts and pioneers in their respective fields, this book

• describes progress in growth technologies of cadmium zinc telluride (CdZnTe) and cadmium telluride (CdTe) materials
• shows variety of specific detector structure designs and their integration with front-end amplification/processing electronics
• presents detection systems based on CdZnTe and CdTe detector technologies that are optimized for specific applications. The designed systems are characterized in terms of their spectral responses, spatial and timing resolutions
• addresses incomplete charge collection, pulse pileup, charge sharing between neighboring detector pixels and other phenomena that can degrade the spectral response of photon-counting detectors
• reports new developments of silicon photomultipliers used for reading the light from scintillators that starting to make a big impact particularly in the design concepts of novel medical instrumentation

With its combined coverage of new materials and innovative new system approaches, as well as a succinct overview of recent developments, this book is an invaluable tool for any engineer, professional, or student working in electronics or an associated field. Readers can refer to the second book to get a detailed understanding of more specific applications of the detection systems in medical imaging, industrial testing and security applications.

Jan Iwanczyk is a consultant to Universities and private companies since July 2017. He has served as a President and CEO of DxRay, Inc., Northridge, California, from 2005 to 2017.

Krzysztof (Kris) Iniewski is managing R&D development activities at Redlen Technologies Inc., a detector company based in British Columbia, Canada. During his 15 years at Redlen he has managed development of highly integrated CZT detector products in medical imaging and security applications.