Random Non-Random Periodic Faulting in Crystals
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Author_M.T. Sebastian
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Author_P. Krishna
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close-packed structures
Configurational Entropy
configurations
crystallography
deformation
Deformation Fault
Diffuse Intensity Distribution
dislocations
electron diffraction analysis
energy
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Fault Configuration
faults
FCC Structure
Hexagonal Close Packing
Hexagonal Unit Cell
Krishna
Octahedral Voids
Oscillation Photograph
phase transitions
polytype
Polytype Structures
polytypism
Reciprocal Lattice
Rhombohedral Lattice
screw
Screw Dislocation Mechanism
Screw Dislocations
Shockley Partials
SiC Crystal
SiC Polytype
stacking fault detection techniques
Stacking Fault Energy
Stacking Faults
Stacking Sequence
stacking-fault
structures
Super-lattice Structures
Tetrahedral Voids
Unit Cell
X-ray diffraction methods
ZnS Crystal
Product details
- ISBN 9782881249259
- Weight: 861g
- Dimensions: 161 x 237mm
- Publication Date: 31 Mar 1994
- Publisher: Gordon & Breach Science Publishers SA
- Publication City/Country: NL
- Product Form: Hardback
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This book provides a comprehensive overview of stacking faults in crystal structures. Subjects covered include: notations used in representations of close-packed structures; types of faults; methods of detection and measurement such as X-ray diffraction, electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions; specific examples of - close packed structures including, zinc sulphide, silicon carbide and silver iodide.
