Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
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A01=Nobuo Tanaka
Atomic Resolution
Author_Nobuo Tanaka
Category=PHJ
Dark Field Images
Elemental Mapping
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HAADF-STEM
Nanoanalysis
Nanodiffraction
Nanofabrication
Nanomaterials
STEM
Product details
- ISBN 9781848167896
- Publication Date: 13 Oct 2014
- Publisher: Imperial College Press
- Publication City/Country: GB
- Product Form: Hardback
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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
