Second-order Nonlinear Optical Characterization Techniques

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A01=Koen Clays
A01=Thierry Verbiest
A01=Vincent Rodriguez
advanced microscopy methods
Author_Koen Clays
Author_Thierry Verbiest
Author_Vincent Rodriguez
beam
Beam Waist
Category=PHJ
Category=PNF
Charge Transfer Absorption Band
chiral interface detection
Chiral Sample
Depolarization Ratio
Electric Dipole Approximation
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fluorescence imaging techniques
gaussian
Gaussian Beam
generation
gouy
Gouy Phase Shift
Hyper-Rayleigh Scattering
index
interfaces surfaces and thin films
Lb Film
Magnetic Dipole Contributions
Maker Fringe
material science characterization
Microscope Imaging Modes
molecular symmetry analysis
NLO
Nonlinear optical
Nonlinear Optical Activity
Nonlinear Optical Properties
Nonlinear Optical Response
Nonlinear Optical Technique
nonlinear optics for biological samples
Numerical Aperture
optical imaging techniques
Optical Rotation
Organic Field Effect Transistor
phase
refractive
second-harmonic
Second-harmonic generation and sum-frequency
SFG
SHG Imaging
SHG Signal
sum-frequency
surface spectroscopy
Susceptibility Components
TPEF Imaging
waist

Product details

  • ISBN 9781420070712
  • Weight: 478g
  • Dimensions: 156 x 234mm
  • Publication Date: 19 Feb 2009
  • Publisher: Taylor & Francis Inc
  • Publication City/Country: US
  • Product Form: Hardback
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Although chemists, biochemists, biologists, and material scientists are often interested in using nonlinear optical techniques for characterizing their samples, they seldom have the necessary background to exploit these methods. Designed for nonspecialists, Second-Order Nonlinear Optical Characterization Techniques: An Introduction focuses on the potential of second-order nonlinear optics as a powerful characterization tool. Avoiding extensive mathematical details, this multidisciplinary book does not require a background in advanced mathematics or physics.

After introducing linear optics from the perspective of polarizability and linear susceptibility, the authors cover incoherent second-harmonic generation. They then deal with the study of surfaces and interfaces, exploiting the intrinsic surface sensitivity of second-harmonic generation and sum-frequency generation. The final chapter discusses second-order imaging techniques, including confocal microscopy and two-photon excited fluorescence microscopy.

Accessible to a wide range of scientists, this concise book stresses the reliability of nonlinear optical processes for probing surfaces and interfaces. Drawing on the insight offered in the text, scientists from many disciplines can now clearly understand and use second-order nonlinear optical methods.

Thierry Verbiest, Koen Clays, Vincent Rodriguez

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