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Secondary Ion Mass Spectroscopy of Solid Surfaces

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adsorption catalysis studies
advanced surface mass spectrometry techniques
Binding Energy
Category=PNFS
depth profiling method
Einzel Lens
Electron Spectroscopy
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Ion Beam
Ion Image
Ion Microprobe
Ion Optics
Ion Source
Liquid Metal Ion Source
Mass Spectral Resolution
Mass Spectrum
Mo Surface
organic material profiling
Primary Ion
Primary Ion Energy
Primary Ion Source
quantitative elemental analysis
Secondary Ion
Secondary Ion Emission
Secondary Ion Mass Spectrometry
Secondary Ion Mass Spectroscopy
Secondary Ion Yield
semiconductor surface analysis
Sim Analysis
solid surfaces
spatially multidimensional analysis
Static Sim
surface characterisation
thin film investigation
Transition Metals
UHV Condition
Wien Filter

Product details

  • ISBN 9789067640787
  • Weight: 362g
  • Dimensions: 156 x 234mm
  • Publication Date: 01 Dec 1987
  • Publisher: Brill
  • Publication City/Country: NL
  • Product Form: Hardback
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Description

This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces.

It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis.