Software Process Dynamics

Regular price €118.99
Quantity:
In stock with our UK publisher. 14-28 days
Delivery/Collection within 10-20 working days
14 days return policy Shipping & Delivery
A01=Raymond J. Madachy
advance
author
Author_Raymond J. Madachy
best software engineering
book
books
Category=UMZ
consultant
decade
dynamics
entire
eq_bestseller
eq_computing
eq_isMigrated=1
eq_isMigrated=2
eq_nobargain
eq_non-fiction
important aspects
important book
internationally
major
march
material
new textbook
software
twentyseven
wealth

Product details

  • ISBN 9780471274551
  • Weight: 1021g
  • Dimensions: 163 x 242mm
  • Publication Date: 15 Feb 2008
  • Publisher: John Wiley & Sons Inc
  • Publication City/Country: US
  • Product Form: Hardback
Secure checkout Fast Shipping Easy returns
This book is designed for professionals and students in software engineering or information technology who are interested in understanding the dynamics of software development in order to assess and optimize their own process strategies. It explains how simulation of interrelated technical and social factors can provide a means for organizations to vastly improve their processes. It is structured for readers to approach the subject from different perspectives, and includes descriptive summaries of the best research and applications.
Raymond J. Madachy, PhD, is a Research Assistant Professor in the USC Industrial and Systems Engineering Department and a Principal of the USC Center for Systems and Software Engineering. Dr. Madachy's current research interests include modeling and simulation of processes for architecting and engineering of complex software-intensive systems; economic analysis and value-based engineering of software-intensive systems; systems and software measurement, process improvement, and quality; quantitative methods for systems risk management; integrating systems engineering and software engineering disciplines; and integrating empirical-based research with process simulation. He is a Senior Member of IEEE and a member of ACM.

More from this author