A01=D Bissell
advanced quality control techniques
attribute data analysis
Author_D Bissell
Category=KJMQ
Category=KJMV5
Category=KJQ
confidence intervals
data visualisation
eq_bestseller
eq_business-finance-law
eq_isMigrated=1
eq_isMigrated=2
eq_nobargain
eq_non-fiction
gauge repeatability
probability distributions
process improvement methods
Product details
- ISBN 9780412394409
- Weight: 634g
- Dimensions: 210 x 280mm
- Publication Date: 15 May 1994
- Publisher: Taylor & Francis Ltd
- Publication City/Country: GB
- Product Form: Hardback
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Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices.
Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered.
Contents
Data Collection and Graphical Summaries
Numerical Data Summaries-Location and Dispersion
Probability and Distribution
Sampling, Estimation, and Confidence
Sample Tests of Hypothesis; "Significance Tests"
Control Charts for Process Management and Improvement
Control Charts for Average and Variation
Control Charts for "Single-Valued" Observations
Control Charts for Attributes and Events
Control Charts: Problems and Special Cases
Cusum Methods
Process Capability-Attributes, Events, and Normally Distributed Data
Capability; Non-Normal Distributions
Evaluating the Precision of a Measurement System (Gauge Capability)
Getting More from Control Chart Data
SPC in "Non-Product" Applications
Appendices
