Statistical Quality Control

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A01=M. Jeya Chandra
advanced statistical quality engineering
allocation
Assembly Characteristic
Author_M. Jeya Chandra
Category=PBT
chart
Concurrent Engineering
Control Charts
Cp Index
Cpk Index
Cpm Index
design
engineering quality assurance
eq_isMigrated=1
eq_isMigrated=2
eq_nobargain
Estimating Process Capability Indexes
experimental design techniques
Exponentially Weighted Moving Average
Fractional Factorial Design
function
loss
Loss Function
Lower Specification Limits
manufacturing process optimization
measurement system analysis
Nested Factor Design
nominal
Nominal Size
Out-of Control Period
Out-of Control State
process
Process Capability Indexes
Process Capability Ratio
process improvement strategies
Quality Characteristic
robust
Robust Design
Sample Batch
size
T1 T2
Ti Ti
tolerance
Tolerance Allocation
tolerance analysis methods
USL LSL
W1 V1

Product details

  • ISBN 9780367397258
  • Weight: 453g
  • Dimensions: 156 x 234mm
  • Publication Date: 25 Feb 2020
  • Publisher: Taylor & Francis Ltd
  • Publication City/Country: GB
  • Product Form: Paperback
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It has recently become apparent that "quality" is quickly becoming the single most important factor for success and growth in business. Companies achieving higher quality in their products through effective quality improvement programs enjoy a significant competitive advantage. It is, therefore, essential for engineers responsible for design, development, and manufacture of products to understand the concepts and techniques of quality control. Statistical Quality Control imparts that understanding. Covering the basic steps in quality assurance and control methodologies, this unique text not only sequences, but also integrates the various techniques presented. The chapters, which include Optimum Process Means and Process Setting, are arranged in logical order. This advanced treatment makes Statistical Quality Control an ideal graduate text as well as a reference for practitioners working in design and quality control.
Chandra, M. Jeya

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