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A01=and Medicine
A01=Committee on Space Radiation Effects Testing Infrastructure for the U.S. Space Program
A01=Division on Engineering and Physical Sciences
A01=Engineering
A01=National Academies of Sciences
A01=National Materials and Manufacturing Board
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and Medicine
Author_and Medicine
Author_Committee on Space Radiation Effects Testing Infrastructure for the U.S. Space Program
Author_Division on Engineering and Physical Sciences
Author_Engineering
Author_National Academies of Sciences
Author_National Materials and Manufacturing Board
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Category1=Non-Fiction
Category=PH
COP=United States
Delivery_Delivery within 10-20 working days
Engineering
eq_bestseller
eq_isMigrated=2
eq_nobargain
eq_non-fiction
eq_science
Language_English
PA=Available
Price_€50 to €100
PS=Active
softlaunch

Product details

  • ISBN 9780309470797
  • Dimensions: 216 x 279mm
  • Publication Date: 08 Jun 2018
  • Publisher: National Academies Press
  • Publication City/Country: US
  • Product Form: Paperback
  • Language: English
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Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling.

Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.

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