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A01=Nicolaas van Vonno
A01=Stephen J. Gaul
A01=Steven H. Voldman
A01=Wesley H. Morris
Age Group_Uncategorized
Age Group_Uncategorized
Author_Nicolaas van Vonno
Author_Stephen J. Gaul
Author_Steven H. Voldman
Author_Wesley H. Morris
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Category1=Non-Fiction
Category=THK
Category=TJFC
COP=United States
Delivery_Delivery within 10-20 working days
Language_English
PA=Available
Price_€100 and above
PS=Active
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Integrated Circuit Design for Radiation Environments

A practical guide to the effects of radiation on semiconductor components of electronic systems, and techniques for the designing, laying out, and testing of hardened integrated circuits

This book teaches the fundamentals of radiation environments and their effects on electronic components, as well as how to design, lay out, and test cost-effective hardened semiconductor chips not only for todays space systems but for commercial terrestrial applications as well. It provides a historical perspective, the fundamental science of radiation, and the basics of semiconductors, as well as radiation-induced failure mechanisms in semiconductor chips.

Integrated Circuits Design for Radiation Environments starts by introducing readers to semiconductors and radiation environments (including space, atmospheric, and terrestrial environments) followed by circuit design and layout. The book introduces radiation effects phenomena including single-event effects, total ionizing dose damage and displacement damage) and shows how technological solutions can address both phenomena.

  • Describes the fundamentals of radiation environments and their effects on electronic components
  • Teaches readers how to design, lay out and test cost-effective hardened semiconductor chips for space systems and commercial terrestrial applications
  • Covers natural and man-made radiation environments, space systems and commercial terrestrial applications
  • Provides up-to-date coverage of state-of-the-art of radiation hardening technology in one concise volume
  • Includes questions and answers for the reader to test their knowledge

Integrated Circuits Design for Radiation Environments will appeal to researchers and product developers in the semiconductor, space, and defense industries, as well as electronic engineers in the medical field. The book is also helpful for system, layout, process, device, reliability, applications, ESD, latchup and circuit design semiconductor engineers, along with anyone involved in micro-electronics used in harsh environments.

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Original price €108.99
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A01=Nicolaas van VonnoA01=Stephen J. GaulA01=Steven H. VoldmanA01=Wesley H. MorrisAge Group_UncategorizedAuthor_Nicolaas van VonnoAuthor_Stephen J. GaulAuthor_Steven H. VoldmanAuthor_Wesley H. Morrisautomatic-updateCategory1=Non-FictionCategory=THKCategory=TJFCCOP=United StatesDelivery_Delivery within 10-20 working daysLanguage_EnglishPA=AvailablePrice_€100 and abovePS=Activesoftlaunch
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Product Details
  • Weight: 839g
  • Dimensions: 170 x 246mm
  • Publication Date: 26 Dec 2019
  • Publisher: John Wiley & Sons Inc
  • Publication City/Country: United States
  • Language: English
  • ISBN13: 9781119966340

About Nicolaas van VonnoStephen J. GaulSteven H. VoldmanWesley H. Morris

STEPHEN J. GAUL is a Senior Principal Engineer at Renesas Electronics Americas Inc. Florida USA. He has worked in the semiconductor/integrated circuit field for over 35 years and has authored many papers and over 35 patents many specific to radiation-hard/radiation-tolerant techniques. NICOLAAS VAN VONNO is currently a Principal Engineer at Renesas Electronics Americas Inc. Florida USA and has been an independent consultant in the radiation effects field. He has been Guest Editor Session Chairman and Short Course Chairman for the IEEE Nuclear and Space Radiation Effects Conference (NSREC). STEVEN H. VOLDMAN Ph.D. is a Consultant on ESD and latchup as well as invention and patenting. He is a Fellow of the Electrical and Electronics Engineers (IEEE) and author of over 10 books and 262 patents. WESLEY H. MORRIS is President of Silicon-X (Technology focus) hardening CMOS devices to radiation and extreme temperatures. His career experience includes development of RH CMOS devices with SOS (RCA) and SOI (Harris) the first to prove bulk CMOS devices can be made latchup immune to extreme SEE radiation and operate reliably at high temperatures (250C). Morris is an author/inventor with multiple papers and patents related to RH and HT topics.

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