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B01=Tibor Grasser
Category1=Non-Fiction
Category=TGPR
Category=TJFC
Category=TJFD5
COP=United States
Delivery_Delivery within 10-20 working days
Language_English
PA=Available
Price_€100 and above
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Bias Temperature Instability for Devices and Circuits

English

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime. See more
Current price €135.84
Original price €142.99
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Age Group_Uncategorizedautomatic-updateB01=Tibor GrasserCategory1=Non-FictionCategory=TGPRCategory=TJFCCategory=TJFD5COP=United StatesDelivery_Delivery within 10-20 working daysLanguage_EnglishPA=AvailablePrice_€100 and abovePS=Activesoftlaunch
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Product Details
  • Dimensions: 155 x 235mm
  • Publication Date: 23 Oct 2013
  • Publisher: Springer-Verlag New York Inc.
  • Publication City/Country: United States
  • Language: English
  • ISBN13: 9781461479086

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