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B09=Martin Htch
B09=Peter W. Hawkes
Category1=Non-Fiction
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Category=TJF
Category=TTB
Category=UYS
COP=United States
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Coulomb Interactions in Particle Beams: Volume 230

English

Coulomb Interactions in Particle Beams, Volume 230, the latest release in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. See more
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Age Group_Uncategorizedautomatic-updateB09=Martin HtchB09=Peter W. HawkesCategory1=Non-FictionCategory=TGBCategory=TJFCategory=TTBCategory=UYSCOP=United StatesDelivery_Pre-orderLanguage_EnglishPA=Not yet availablePrice_€100 and abovePS=Forthcomingsoftlaunch

Will deliver when available. Publication date 25 Oct 2024

Product Details
  • Weight: 450g
  • Dimensions: 152 x 229mm
  • Publication Date: 25 Oct 2024
  • Publisher: Elsevier Science Publishing Co Inc
  • Publication City/Country: United States
  • Language: English
  • ISBN13: 9780443297847

About

Peter Hawkes obtained his M.A. and Ph.D (and later Sc.D.) from the University of Cambridge where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 1975 he worked in the electron microscope section of the Cavendish Laboratory in Cambridge after which he joined the CNRS Laboratory of Electron Optics in Toulouse of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Dr Martin Htch serial editor for the book series Advances in Imaging and Electron Physics (AIEP)” is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on Quantitative high-resolution transmission electron microscopy (HRTEM)” joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH) two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004 he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals filed 6 patents and has given over 70 invited talks at international conferences and workshops.

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