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B01=Chi-Hung Hwang
B01=Cosme Furlong
B01=Frank DelRio
B01=Ming-Tzer Lin
B01=Mohammad Naraghi
Category1=Non-Fiction
Category=TBN
Category=TGB
Category=TGM
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Advancements in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4: Proceedings of the 2022 Annual Conference on Experimental and Applied Mechanics

English

Advancements in Optical Methods, Digital Image Correlation & Micro-and Nanomechanics, Volume 4 of the Proceedings of the 2022 SEM Annual Conference & Exposition on Experimental and Applied Mechanics, the fourth volume of six from the Conference, brings together contributions to this important area of research and engineering.  The collection presents early findings and case studies on a wide range of optical methods ranging from traditional photoelasticity and interferometry to more recent DIC and DVC techniques, and includes papers in the following general technical research areas:

 

DIC Methods & Its Applications

Photoelsticity and Interferometry Applications

Micro-Optics and Microscopic Systems

Multiscale and New Developments in Optical Methods

Extreme Nanomechanics

In-Situ Nanomechanics

Expanding Boundaries in Metrology

Micro and Nanoscale Deformation

MEMS for Actuation, Sensing and Characterization

1D & 2D Materials


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Current price €171.76
Original price €192.99
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Age Group_Uncategorizedautomatic-updateB01=Chi-Hung HwangB01=Cosme FurlongB01=Frank DelRioB01=Ming-Tzer LinB01=Mohammad NaraghiCategory1=Non-FictionCategory=TBNCategory=TGBCategory=TGMCategory=TTBMCOP=SwitzerlandDelivery_Delivery within 10-20 working daysLanguage_EnglishPA=AvailablePrice_€100 and abovePS=Activesoftlaunch
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Product Details
  • Weight: 249g
  • Dimensions: 210 x 279mm
  • Publication Date: 12 Feb 2024
  • Publisher: Springer International Publishing AG
  • Publication City/Country: Switzerland
  • Language: English
  • ISBN13: 9783031174735

About

Ming-Tzer Lin - National Chung Hsing University Taiwan; Cosme Furlong - Worcester Polytechnic Institute USA; Chi-Hung Hwang-Instrument Technology Research Center Taiwan; Mohammad Naraghi Texas A&M University USA; Frank DelRio National Institutes of Standards and Technology Boulder CO USA

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